J. Zakizadeh (Canada), S.R. Das (Canada, USA), M.H. Assaf, E.M. Petriu (Canada), and M. Sahinoglu (U
Automatic test equipment (ATE), built-in self-test (BIST),
circuit under test (CUT), design-for-testability (DFT),
mixed-signal test, OBIST, SOC.
This paper investigates oscillation-based built-in self-test
(OBIST) techniques for testing analog parts in mixed
signal circuits. OBIST methods require neither stimulus
generators nor complex response analyzers, and have
been successfully applied in testing analog circuits in
mixed-signal system-on-chip (SOC) environments. In the
paper, analog circuit test methodologies based on the
principle of OBIST were implemented. Simulation results
on some sample analog benchmark circuits are provided
to demonstrate the merit of the proposed implementations.