R. Ubar, J. Raik, T. Evartson, M. Kruus, and H. Lensen (Estonia)
Digital systems, faults and defects, modelling, simulation,
test generation, Boolean derivatives, decision diagrams.
To cope with the complexity of today’s digital systems in
diagnostic modelling, hierarchical approaches should be
used. In this paper, the possibilities of using Decision
Diagrams (DD) for diagnostic modelling of digital
systems are discussed. DDs can be used for modelling
systems at different levels of representation like logic
level, register transfer level, instruction set level. The
nodes in DDs can be modelled as generic locations of
faults. For more precise general specification of faults
logic constraints are used. To map the physical defects
from transistor level to logic level a new functional fault
model is introduced.