H. Al-Asaad
Global fault collapsing, fault simulation, testing, combinational circuits
Fault collapsing is the process of reducing the number of faults by using redundance and equivalence/dominance relationships among faults. Exact global fault collapsing (EGFC) can be easily applied locally at the logic gates; however, it is often ignored for library modules due to its high demand of resources such as execution time and/or memory. In this paper, we present three methods for global fault collapsing for library modules: (i) an EGFC method that uses binary decision diagrams, (ii) an approximate global fault collapsing method that uses fault simulation with random vectors and (iii) an EGFC method that uses both binary decision diagrams and fault simulation with random vectors. Experimental results show that the three methods reduce the number of faults drastically with feasible resources and produce significantly better results than existing approaches.
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