Collection of Test Case Sequences: Covering of Function Cluster Digraph

M.Sh. Levin and M. Last (Israel)

Keywords

System testing, Inputoutput analysis, Functional testing, Test case sequence, Combinatorial optimiza tion, Chain covering of digraph, Combinatorial algo rithms

Abstract

The paper focuses on multi-function system testing in the case of multi-stage testing process. In this pa per we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial al gorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illus trate our approach.

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