Surface Inspection and Segmentation based on Local Reflectivity Properties

V. Putz, D. Wolfinger, and B.G. Zagar (Austria)


gonioreflectometry, surface inspection, image segmentation, polarimetry


: Image processing based surface inspection systems operate on various clues derived from a wide range of surface characteristics like gray–level values, color hues, polarization features, clues from stereoscopic views to name just a few. In this work we present image processing algorithms that allow an image segmentation on the char acteristics the local reflection indicatrix is able to provide. Surface areas can be segmented into specular or diffusely reflecting zones as well as in zones determined by the di rection of the local surface normal.

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