Nano-Particle Material Classification by Focused Gaussian Beam Scattering

E. Hemo, B. Spektor, and J. Shamir (Israel)


Nano particles, optical measurements, optical classification.


The scattering process of light by small particles is well documented. However, conventional methods of particle analysis by light scattering employ wide illumination of large ensembles of particles. With such an approach no in formation can be obtained about single particles due to their weak interaction. In this work we show that single particles can be classified with respect to their material composition by analyzing the scattering pattern of a focused Gaussian beam.

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