Collection of Test Case Sequences: Covering of Function Cluster Digraph

M.Sh. Levin and M. Last (Israel)


System testing, Input-output analysis, Functional testing, Test case sequence, Combinatorial optimiza tion, Chain covering of digraph, Combinatorial algo rithms


The paper focuses on multi-function system testing in the case of multi-stage testing process. In this pa per we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial al gorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illus trate our approach.

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