Extraction Method of the Dielelectric Tensor Characteristics for Nematic Liquid Crystals using Two-layer Shielded Microstrip

J. Hinojosa and J. Martínez (Spain)


Electromagnetic properties of materials, anisotropy, Sparameters, microstrip.


A broadband extraction method of the dielectric tensor for nematic liquid crystals, associated with a measuring cell is presented. The dielectric tensor is computed from parameter obtained at the input plane of an open-end two layer shielded microstrip line, which is used as measuring cell and loaded with the liquid crystal to be characterized. The extraction method of the dielectric tensor is based on the propagation of the even mode in the measuring cell. It is fast and easy. It uses analytical relationships, which are presented in this paper. The simulation results have demonstrated the validity of this extraction method in the 1MHz-10GHz frequency range for the characterization of nematic liquid crystals.

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